Ronald Alle: search on Z-Library

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1

The sensitivity of radiation-induced leakage to STI topology and sidewall doping

Nadia Rezzak, Michael L. Alles, Ronald D. Schrimpf, Sarah Kalemeris, Lloyd W. Massengill, John Sochacki, Hugh J. Barnaby

Journal:

Microelectronics Reliability

Year:

2011

Language:

english

File:

PDF, 1.10 MB

english, 2011

2

The impact of device width on the variability of post-irradiation leakage currents in 90 and 65 nm CMOS technologies

Nadia Rezzak, Pierre Maillard, Ronald D. Schrimpf, Michael L. Alles, Daniel M. Fleetwood, Yanfeng Albert Li

Journal:

Microelectronics Reliability

Year:

2012

Language:

english

File:

PDF, 1.22 MB

english, 2012

3

[IEEE 2010 IEEE International SOI Conference - San Diego, CA, USA (2010.10.11-2010.10.14)] 2010 IEEE International SOI Conference (SOI) - Total-ionizing-dose radiation response of partially-depleted SOI devices

Rezzak, Nadia, Zhang, En Xia, Alles, Michael L., Schrimpf, Ronald D., Hughes, Harold

Year:

2010

Language:

english

File:

PDF, 1.09 MB

english, 2010

4

Total-ionizing-dose effects and reliability of carbon nanotube FET devices

Zhang, Cher Xuan, Zhang, En Xia, Fleetwood, Daniel M., Alles, Michael L., Schrimpf, Ronald D., Rutherglen, Chris, Galatsis, Kosmas

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 692 KB

english, 2014

5

Substrate Engineering Concepts to Mitigate Charge Collection in Deep Trench Isolation Technologies

Pellish, Jonathan A., Reed, Robert A., Schrimpf, Ronald D., Alles, Michael L., Varadharajaperumal, Muthubalan, Niu, Guofu, Sutton, Akil K., Diestelhorst, Ryan M., Espinel, Gustavo, Krithivasan, Ramkum

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 706 KB

english, 2006

6

Dynamic Modeling of Radiation-Induced State Changes in ${\hbox {HfO}_2}/\hbox {Hf}$ 1T1R RRAM

Bennett, William G., Hooten, Nicholas C., Schrimpf, Ronald D., Reed, Robert A., Alles, Michael L., Zhang, En Xia, Weeden-Wright, Stephanie L., Linten, Dimitri, Jurczak, Malgorzata, Fantini, Andrea

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 1015 KB

english, 2014

7

Book reviews

Brus, W., Hazard, John N., Mawdsley, Evan, Meyer, Alfred G., Johnson, Douglas K., Amann, Ronald, North, Robert N., McAuley, A., Baylis, Thomas A., Moreton, Edwina, Singleton, F., Johnson, A. Ross, All

Journal:

Year:

1976

Language:

english

File:

PDF, 1.99 MB

english, 1976

8

Total Ionizing Dose Effects on Strained Ge pMOS FinFETs on Bulk Si

Zhang, En Xia, Fleetwood, Daniel M., Hachtel, Jordan A., Liang, Chundong, Reed, Robert A., Alles, Michael L., Schrimpf, Ronald D., Linten, Dimitri, Mitard, Jerome, Chisholm, Matthew F., Pantelides, So

Journal:

IEEE Transactions on Nuclear Science

Year:

2017

Language:

english

File:

PDF, 583 KB

english, 2017

9

The study of radiation effects in emerging micro and nano electro mechanical systems (M and NEMs)

Arutt, Charles N, Alles, Michael L, Liao, Wenjun, Gong, Huiqi, Davidson, Jim L, Schrimpf, Ronald D, Reed, Robert A, Weller, Robert A, Bolotin, Kirill, Nicholl, Ryan, Pham, Thang Toan, Zettl, Alex, Qin

Journal:

Semiconductor Science and Technology

Year:

2017

Language:

english

File:

PDF, 2.10 MB

english, 2017

10

Radiation Response and Adaptive Control-Based Degradation Mitigation of MEMS Accelerometers in Ionizing Dose Environments

Pitt, E. Bryn, Barth, Eric J., Diggins, Zachary J., Mahadevan, Nagabhushan, Karsai, Gabor, Sierawski, Brian D., Reed, Robert A., Schrimpf, Ronald D., Weller, Robert A., Alles, Michael L., Witulski, Ar

Journal:

IEEE Sensors Journal

Year:

2017

Language:

english

File:

PDF, 2.75 MB

english, 2017

11

Pulsed microwave induced light, sound, and electrical discharge enhanced by a biopolymer

Johnathan L. Kiel, Ronald L. Seaman, Satnam P. Mathur, Jill E. Parker, John R. Wright, John L. Alls, Pedro J. Morales

Journal:

Bioelectromagnetics

Year:

1999

Language:

english

File:

PDF, 172 KB

english, 1999

12

Alkali Metal Doped Organic Molecules on Insulators: Charge Impact on the Optical Properties

Thomas Dienel, Andreas Krause, Ronald Alle, Roman Forker, Klaus Meerholz, Torsten Fritz

Journal:

Advanced Materials

Year:

2010

Language:

english

File:

PDF, 619 KB

english, 2010

13

Comparison of four electrolyte instruments using the proposed NCCLS protocol for evaluation of precision and accuracy of automated instruments

Sharon W. McClean, Ronald J. Elin, David Alling, Ruth Chesler, Shirley Siegel, Anna R. Utter, Maurice Green

Journal:

Clinical Biochemistry

Year:

1980

Language:

english

File:

PDF, 578 KB

english, 1980

14

Reply to Dr. Russell by Dr. McClean:—

Sharon W. McClean, Ronald J. Elin, David W. Alling, John Koett, Wolf Paul L.

Journal:

Clinical Biochemistry

Year:

1981

Language:

english

File:

PDF, 225 KB

english, 1981

15

GpaXItarloriginating fromSolanum tarijenseis a major resistance locus toGlobodera pallidaand is localised on chromosome11of potato

M. Y. Adillah Tan, Tae-Ho Park, René Alles, Ronald C. B. Hutten, R. G. F. Visser, Herman J. van Eck

Journal:

Theoretical and Applied Genetics

Year:

2009

Language:

english

File:

PDF, 429 KB

english, 2009

16

Pyramiding ofMeloidogyne haplaResistance Genes in Potato Does Not Result in an Increase of Resistance

M. Y. Adillah Tan, René Alles, Ronald C. B. Hutten, Richard G. F. Visser, Herman J. van Eck

Journal:

Potato Research

Year:

2009

Language:

english

File:

PDF, 191 KB

english, 2009

17

Molekularer Sauerstoff als Redox-Katalysator in intramolekularen Cumarin-Photocycloadditionen

Dipl.-Chem. Darius Paul Kranz, Prof. Dr. Axel Georg Griesbeck, Dr. Ronald Alle, Dr. Raul Perez-Ruiz, Dr. Jörg Martin Neudörfl, Prof. Dr. Klaus Meerholz, Prof. Dr. Hans-Günther Schmalz

Journal:

Angewandte Chemie

Year:

2012

Language:

german

File:

PDF, 787 KB

german, 2012

18

Molecular Oxygen as a Redox Catalyst in Intramolecular Photocycloadditions of Coumarins

Dipl.-Chem. Darius Paul Kranz, Prof. Dr. Axel Georg Griesbeck, Dr. Ronald Alle, Dr. Raul Perez-Ruiz, Dr. Jörg Martin Neudörfl, Prof. Dr. Klaus Meerholz, Prof. Dr. Hans-Günther Schmalz

Journal:

Angewandte Chemie International Edition

Year:

2012

Language:

english

File:

PDF, 788 KB

english, 2012

19

Charge Collection and Charge Sharing in a 130 nm CMOS Technology

Amusan, Oluwole A., Witulski, Arthur F., Massengill, Lloyd W., Bhuva, Bharat L., Fleming, Patrick R., Alles, Michael L., Sternberg, Andrew L., Black, Jeffrey D., Schrimpf, Ronald D.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 978 KB

english, 2006

20

Low-Energy X-ray and Ozone-Exposure Induced Defect Formation in Graphene Materials and Devices

Zhang, En Xia, Newaz, A. K. M., Wang, Bin, Bhandaru, Shweta, Zhang, C. Xuan, Fleetwood, Daniel M., Bolotin, Kirill I., Pantelides, Sokrates T., Alles, Michael L., Schrimpf, Ronald D., Weiss, Sharon M.

Journal:

IEEE Transactions on Nuclear Science

Year:

2011

Language:

english

File:

PDF, 444 KB

english, 2011

21

Molecular markers of Alzheimer's Disease pathology and their relationship with default mode network integrity

Sofie Adriaanse, Ernesto Sanz-Arigita, Maja Binnewijzend, Nelleke Tolboom, Alle Meije Wink, Ronald Boellaard, Maqsood Yaqub, Albert Windhorst, Wiesje Van der Flier, Philip Scheltens, Adriaan Lammertsm

Journal:

Alzheimer's & Dementia

Year:

2011

Language:

english

File:

PDF, 166 KB

english, 2011

22

The Impact of Delta-Rays on Single-Event Upsets in Highly Scaled SOI SRAMs

King, Michael P., Reed, Robert A., Weller, Robert A., Mendenhall, Marcus H., Schrimpf, Ronald D., Alles, Michael L., Auden, Elizabeth C., Armstrong, Sarah E., Asai, Makoto

Journal:

IEEE Transactions on Nuclear Science

Year:

2010

Language:

english

File:

PDF, 639 KB

english, 2010

23

The Application of RHBD to n-MOSFETs Intended for Use in Cryogenic-Temperature Radiation Environments

Jun, Bongim, Sutton, Akil K., Diestelhorst, Ryan M., Duperon, Gregory J., Cressler, John D., Black, Jeffrey D., Haeffner, Tim, Reed, Robert A., Alles, Michael L., Schrimpf, Ronald D., Fleetwood, Danie

Journal:

IEEE Transactions on Nuclear Science

Year:

2007

Language:

english

File:

PDF, 663 KB

english, 2007

24

Temperature Dependence of Digital Single-Event Transients in Bulk and Fully-Depleted SOI Technologies

Gadlage, Matthew J., Ahlbin, Jonathan R., Ramachandran, Vishwanath, Gouker, Pascale, Dinkins, Cody A., Bhuva, Bharat L., Narasimham, Balaji, Schrimpf, Ronald D., McCurdy, Michael W., Alles, Michael L.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 751 KB

english, 2009

25

[IEEE 2013 IEEE Aerospace Conference - Big Sky, MT (2013.3.2-2013.3.9)] 2013 IEEE Aerospace Conference - Total ionizing dose effects and reliability of graphene-based non-volatile memory devices

Zhang, Cher Xuan, Zhang, En Xia, Fleetwood, Daniel M., Alles, Michael L., Schrimpf, Ronald D., Song, Emil B., Galatsis, Kosmas, Newaz, A. K. M., Bolotin, K. I.

Year:

2013

Language:

english

File:

PDF, 19.79 MB

english, 2013

26

Solution Processable Organic Field-Effect Transistors Utilizing an α,α‘-Dihexylpentathiophene-Based Swivel Cruciform

Zen, Achmad, Bilge, Askin, Galbrecht, Frank, Alle, Ronald, Meerholz, Klaus, Grenzer, Jörg, Neher, Dieter, Scherf, Ullrich, Farrell, Tony

Journal:

Journal of the American Chemical Society

Year:

2006

Language:

english

File:

PDF, 47 KB

english, 2006

27

Photophysical properties and OLED performance of light-emitting platinum(ii) complexes

Kourkoulos, Dimitrios, Karakus, Cüneyt, Hertel, Dirk, Alle, Ronald, Schmeding, Sebastian, Hummel, Johanna, Risch, Nikolaus, Holder, Elisabeth, Meerholz, Klaus

Journal:

Dalton Transactions

Year:

2013

Language:

english

File:

PDF, 708 KB

english, 2013

28

Radiation Effects on LiNbO$_2$ Memristors for Neuromorphic Computing Applications

Greenlee, Jordan D., Shank, Joshua C., Tellekamp, M. Brooks, Zhang, En Xia, Bi, Jinshun, Fleetwood, Daniel M., Alles, Michael L., Schrimpf, Ronald D., Doolittle, W. Alan

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 1020 KB

english, 2013

29

Layout-Related Stress Effects on Radiation-Induced Leakage Current

Rezzak, Nadia, Schrimpf, Ronald D., Alles, Michael L., Zhang, En Xia, Fleetwood, Daniel M., Li, Yanfeng Albert

Journal:

IEEE Transactions on Nuclear Science

Year:

2010

Language:

english

File:

PDF, 589 KB

english, 2010

30

[IEEE 2007 IEEE International Conference on Integrated Circuit Design and Technology - Austin, TX, USA (2007.05.30-2007.06.1)] 2007 IEEE International Conference on Integrated Circuit Design and Technology - Soft Error Considerations for Multicore Microprocessor Design

Robinson, William H., Alles, Michael L., Bapty, Theodore A., Bhuva, Bharat L., Black, Jeffrey D., Bonds, Alfred B., Massengill, Lloyd W., Neema, Sandeep K., Schrimpf, Ronald D., Scott, Jason M.

Year:

2007

Language:

english

File:

PDF, 1.62 MB

english, 2007

31

Unexpected Side Chain Oxidation in a Swivel Cruciform Oligothiophene

Koenen, Jan-Moritz, Bilge, Askin, Allard, Sybille, Alle, Ronald, Meerholz, Klaus, Scherf, Ullrich

Journal:

Organic Letters

Year:

2009

Language:

english

File:

PDF, 234 KB

english, 2009

32

Mitigation of Single-Event Charge Sharing in a Commercial FPGA Architecture

Kelly, Andrew T., Alles, Michael L., Ball, Dennis R., Massengill, Lloyd W., Ramaswamy, S., Haddad, Nadim F., Brown, Ronald D., Fleming, Patrick R., Chan, Ernesto, Ekanayake, Virantha, Kelly, Clinton W

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 1.30 MB

english, 2014

33

Single- and Multiple-Event Induced Upsets in ${\rm HfO}_2/{\rm Hf}$ 1T1R RRAM

Bennett, William G., Hooten, Nicholas C., Schrimpf, Ronald D., Reed, Robert A., Mendenhall, Marcus H., Alles, Michael L., Bi, Jinshun, Zhang, En Xia, Linten, Dimitri, Jurzak, Malgorzata, Fantini, Andr

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 954 KB

english, 2014

34

Use of a Contacted Buried ${\rm n}^{+}$ Layer for Single Event Mitigation in 90 nm CMOS

DasGupta, Sandeepan, Amusan, Oluwole A., Alles, Michael L., Witulski, Arthur F., Massengill, Lloyd W., Bhuva, Bharat L., Schrimpf, Ronald D., Reed, Robert A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 636 KB

english, 2009

35

Second Harmonic Generation for Noninvasive Metrology of Silicon-on-Insulator Wafers

Alles, Michael L., Pasternak, Robert, Lu, Xiong, Tolk, Norman H., Schrimpf, Ronald D., Fleetwood, Daniel M., Dolan, Robert P., Standley, Robert W.

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2007

Language:

english

File:

PDF, 876 KB

english, 2007

36

Single Event Upset Mechanisms for Low-Energy-Deposition Events in SiGe HBTs

Montes, Enrique J., Reed, Robert A., Pellish, Jonathan A., Alles, Michael L., Schrimpf, Ronald D., Weller, Robert A., Varadharajaperumal, Muthubalan, Niu, Guofu, Sutton, Akil K., Diestelhorst, Ryan, E

Journal:

IEEE Transactions on Nuclear Science

Year:

2008

Language:

english

File:

PDF, 617 KB

english, 2008

37

Total-Ionizing-Dose Response of Narrow, Long Channel 45 nm PDSOI Transistors

Alles, Michael L., Hughes, Harold L., Ball, Dennis R., McMarr, Patrick J., Schrimpf, Ronald D.

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 1.20 MB

english, 2014

38

[IEEE 2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Sevilla, Spain (2011.09.19-2011.09.23)] 2011 12th European Conference on Radiation and Its Effects on Components and Systems - Impact of process variability on the radiation-induced soft error of nanometer-scale srams in hold and read conditions

Griffoni, Alessio, Zuber, Paul, Dobrovolny, Petr, Roussel, Philippe J., Linten, Dimitri, Alles, Michael L., Schrimpf, Ronald D., Reed, Robert A., Massengill, Lloyd W., Kobayashi, Daisuke, Simoen, Eddy

Year:

2011

Language:

english

File:

PDF, 704 KB

english, 2011

39

Amyloid and its association with default network integrity in Alzheimer's disease

Adriaanse, Sofie M., Sanz-Arigita, Ernesto J., Binnewijzend, Maja A.A., Ossenkoppele, Rik, Tolboom, Nelleke, van Assema, Daniëlle M.E., Wink, Alle Meije, Boellaard, Ronald, Yaqub, Maqsood, Windhorst,

Journal:

Human Brain Mapping

Year:

2014

Language:

english

File:

PDF, 486 KB

english, 2014

40

Total-Ionizing-Dose Induced Timing Window Violations in CMOS Microcontrollers

Diggins, Zachary J., Mahadevan, Nagabhushan, Herbison, Daniel, Karsai, Gabor, Sierawski, Brian D., Barth, Eric, Pitt, E. Bryn, Reed, Robert A., Schrimpf, Ronald D., Weller, Robert. A., Alles, Michael

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 689 KB

english, 2014

41

[IEEE 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Oxford, United Kingdom (2013.9.23-2013.9.27)] 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Mitigation of single-event charge sharing in a commercial FPGA architecture

Kelly, Andrew T., Alles, Michael L., Ball, Dennis R., Massengill, Lloyd W., Ramaswamy, S., Haddad, Nadim F., Brown, Ronald D., Fleming, Patrick R., Chan, Ernesto, Ekanayake, Virantha, Kelly, Clinton W

Year:

2013

Language:

english

File:

PDF, 1.68 MB

english, 2013

42

Total Ionizing Dose Effects on FinFET-Based Capacitor-Less 1T-DRAMs

Zhang, En Xia, Fleetwood, Daniel M., El-Mamouni, Farah, Alles, Michael L., Schrimpf, Ronald D., Xiong, Weize, Hobbs, Chris, Akarvardar, Kerem, Cristoloveanu, Sorin

Journal:

IEEE Transactions on Nuclear Science

Year:

2010

Language:

english

File:

PDF, 741 KB

english, 2010

43

Bias Dependence of Total Ionizing Dose Effects in SiGe-${{\rm SiO}_2}/{{\rm HfO}_2}\ p$MOS FinFETs

Duan, Guo Xing, Zhang, Cher Xuan, Zhang, En Xia, Hachtel, Jordan, Fleetwood, Daniel M., Schrimpf, Ronald D., Reed, Robert A., Alles, Michael L., Pantelides, Sokrates T., Bersuker, Gennadi, Young, Chad

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 863 KB

english, 2014

44

Total Ionizing Dose Effects on hBN Encapsulated Graphene Devices

Zhang, Cher Xuan, Wang, Bin, Duan, Guo Xing, Zhang, En Xia, Fleetwood, Daniel M., Alles, Michael L., Schrimpf, Ronald D., Rooney, Aidan P., Khestanova, Ekaterina, Auton, Gregory, Gorbachev, Roman V.,

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 701 KB

english, 2014

45

Electrical Stress and Total Ionizing Dose Effects on ${\hbox {MoS}}_{2}$ Transistors

Zhang, Cher Xuan, Newaz, A. K. M., Wang, Bin, Zhang, En Xia, Duan, Guo Xing, Fleetwood, Daniel M., Alles, Michael L., Schrimpf, Ronald D., Bolotin, Kirill I., Pantelides, Sokrates T.

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 912 KB

english, 2014

46

State and Angular Dependence of Single-Event Upsets in an Asymmetric RC-Hardened SRAM Using Deep Trench Capacitors

Alles, Michael L., Schrimpf, Ronald D., Massengill, Lloyd W., Ball, Dennis R., Kelly, Andrew T., Haddad, Nadim F., Rodgers, John C., Ross, Jason F., Chan, Ernesto, Raman, Ashok, Turowski, Marek

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 1.08 MB

english, 2014

47

Single-Event Transient Response of InGaAs MOSFETs

Ni, Kai, Zhang, En Xia, Hooten, Nicholas C., Bennett, William G., McCurdy, Michael W., Sternberg, Andrew L., Schrimpf, Ronald D., Reed, Robert A., Fleetwood, Daniel M., Alles, Michael L., Kim, Tae-Woo

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 1.06 MB

english, 2014

48

A blood spot method for detecting fumonisin-induced changes in putative sphingolipid biomarkers in LM/Bc mice and humans

Riley, Ronald T., Showker, Jency L., Lee, Christine M., Zipperer, Cody E., Mitchell, Trevor R., Voss, Kenneth A., Zitomer, Nicholas C., Torres, Olga, Matute, Jorge, Gregory, Simon G., Ashley-Koch, All

Journal:

Food Additives & Contaminants Part A

Year:

2015

Language:

english

File:

PDF, 404 KB

english, 2015

49

Self-Healing of Proton Damage in Lithium Niobite ( ${\rm LiNbO}_{2}$)

Shank, Joshua C., Tellekamp, M. Brooks, Zhang, En Xia, Bennett, W. Geoff, McCurdy, Michael W., Fleetwood, Daniel M., Alles, Michael L., Schrimpf, Ronald D., Doolittle, W. Alan

Journal:

IEEE Transactions on Nuclear Science

Year:

2015

Language:

english

File:

PDF, 830 KB

english, 2015

50

System Health Awareness in Total-Ionizing Dose Environments

Diggins, Zachary J., Mahadevan, Nagabhushan, Pitt, E. Bryn, Herbison, Daniel, Karsai, Gabor, Sierawski, Brian D., Barth, Eric J., Reed, Robert A., Schrimpf, Ronald D., Weller, Robert A., Alles, Michae

Journal:

IEEE Transactions on Nuclear Science

Year:

2015

Language:

english

File:

PDF, 703 KB

english, 2015

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